A CDE Definition
LOOK UP ANOTHER TERM
scan technology
A method for testing chips on the printed circuit board by building the chip with additional input and output pins that are used only for test purposes. Full scan methods test all the registers on the chip. Partial scan tests some of them, and boundary scan tests only the input/output cells. JTAG is the IEEE standard for boundary scan. See also scan rate.
Before/After Your Search Term
| Before | After |
|---|---|
| JScript | JTAPI |
| JSF | JTC1 |
| JSON | judder |
| JSON-LD | juddering |
| JSP | Jughead |
| JSP custom tag | juice |
| JSP tag | Juiced |
| JSQL | juicejacking |
| JSTL | JuJu |
| JTA | jukebox |
Terms By Topic
Click any of the following categories for a list of fundamental terms.